Scanning Electron Microscopy (SEM)
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The JEOL 820 scanning electron microscope at Lehigh Testing Laboratories in New Castle, Delaware, features a large chamber, which can be accessed in a vent-down mode for oversize components, and a small side-entry port for analysis of smaller samples. Lehigh Testing Laboratories also performs energy dispersive spectroscopy (EDS) analysis using an Oxford Instruments light element detector equipped with a 4 pi EDS analysis system.
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Analyses & Evaluations
SEM and EDS are useful for the following analyses and evaluations:
Fracture Evaluations of Failed Components at High Magnifications