d/b/a Lehigh Testing Laboratories

Call Us Today!
(302) 328-0500

Scanning Electron Microscopy

Scanning Electron Microscopy (SEM)

The JEOL 820 scanning electron microscope at Lehigh Testing Laboratories in New Castle, Delaware, features a large chamber, which can be accessed in a vent-down mode for oversize components, and a small side-entry port for analysis of smaller samples. Lehigh Testing Laboratories also performs energy dispersive spectroscopy (EDS) analysis using an Oxford Instruments light element detector equipped with a 4 pi EDS analysis system.

Scanning Electron Microscopy

Analyses & Evaluations

SEM and EDS are useful for the following analyses and evaluations:

Fracture Evaluations of Failed Components at High Magnifications
Particle Analysis of Size, Distribution, & Identification
Image Analysis Using Digital Imaging, Including Dimensional Evaluation & Particle Sizing
Semi-Quantitative Composition Analysis of Elements & Oxides
Contamination Analysis of Residues & Surface Conditions

Light Element Detection & Analysis
Analysis of Specified Multiple Points & Defined Areas Within a Defined Field
Dot Mapping of Regions to Determine Presence of Specified Elements
Line Scanning to Detect Changes in Relative Concentrations